JEDEC STANDARD Temperature, Bias, and Operating Life JESD22- A108F (Revision of JESD22-A108E, December 2016) JULY 2017 JEDEC SOLID STATE TECHNOLOGY ...
These tables briefly describe most of the differences between the text of this standard, JESD22-. A108E, and its predecessors JESD22-A108D (November 2010), ...
JESD22 Series, Reliability Test Methods for Packaged Devices. JESD46, Guidelines for User Notification of Product/process Changes by Semiconductor Suppliers.
JESD22-A108G, Nov 2022. This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the ...
JESD22-A108G ... This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices' ...